10.023 | ChemPattern™ Ultimate - The advanced chemometrics and chemical profiling solutions ( single license ) |
| • For advanced quality control, qualitative and quantitative evaluation, and in-process control of complex system |
| • As well as high-throughput, high-content analysis, various types of omics, informatics research and big data mining |
| • Various types of analytical instrument data processing support and universial data interface technology |
| • Provide all kinds of chromatographic (LC, GC, CE, TLC) data analysis and processing |
| • Provide all kinds of mass spectrometric (QTOF / MS, DART / MS) data analysis and processing |
| • Provide all kinds of spectroscopy (NIR, IR) data analysis and processing |
| • Provide all kinds of NMR (1H-NMR and 13C-NMR) data analysis and processing |
| • Chemometric analysis of general data format are available |
| • Comply with Chinese Pharmacopoeia chromatographic quantitative determination and fingerprinting specifications |
| • Comply with ASTM E-1655 NIR multi-calibration quantitative technique guidances |
| • High-performance multi-thread parallel numerical computing and advanced chemometric analysis |
| • Support massive data batch processing, analysis, visualization and interactive display and result output |
| • Common pattern modeling, multivariate statistics, pattern recognition, artificial intelligence, data mining etc. |
| • Support multivariate techniques: principal component analysis, partial least squares regression, multiple linear regression, |
| • Multivariate analysis of variance, two-dimensional hierarchical clustering, self-organizing map neural networks etc. |
| • Support pattern recognition methods: k-nearest neighbor, partial least squares discriminant analysis, support vector machine, |
| • soft independent modeling of class analogy, self-organizing map neural network and cross-validation etc. |
| • Support similarity algorithms : cosine similairty, correlation coefficient, Euclidean distance, Mahalanobis distance etc., |
| • Including 11 kinds of data pre-treatment algorithms, data reduction, and common pattern generation |
| • Non-linear editing system, supports web dynamic output of real-time analysis result and interactive figure display |
| • Support big data visualization, high-quality rendering of various instrumental data types and statistical charts |
| • 2D/3D chromatogram and mass spectrum display, including overlapping, mirror, boolean, derivation, and truncate etc. |
| • Statistical charts include 2D/3D scatter plot, dendrogram, histogram, contour plots, etc., more than ten kinds of |
| • Provides data static snapshots, support chart layout modification & publication-quality vector graphic editor |
| • All graphs and data tables can be exported to Microsoft Word, Excel, PowerPoint in custom format |
| • User interface, analysis result and report support languages dynamica switch i.e. English/Chinese |
| • 300 pages color-printing user manual, installation manual and chemometrics white paper |
| • Different types of instrumental and analytical chemistry chemometrics solution examples available in demo database |
| • Software can be run on Windows XP/Vista/7/8 operating system, one year of free upgrade |
12.011 12.012 | LC Profiler - Liquid Chromatographic Chemometrics Solution System GC Profiler - Gas Chromatographic Chemometrics Solution System |
| • Supports ASCII, ANDY (AIA), J-CAMP and XLS etc. data format |
| • For HPLC, UPLC, GC and HPCE chromatogram analysis purpose |
| • Batch automatic integration, manual integration, background subtract, smooth, profile combination and truncate |
| • Support external standard method with calibration factors for multi-component quantitative determination |
| • Features include chemical reference definition, group calibration, automatic and manual calibration factor generation |
| • 2D and 3D chromatogram overlapping, profile calculation, retention time alignment, and common pattern modeling |
12.013 | TLC Profiler - Thin Layer Chromatographic Solution System |
| • TLC / HPTLC digital chromatogram track location and digital scan with 7 kinds of scan mode provides |
| • Also suitable for quantitative evaluation of bioluminescence imaging and gel electrophoresis (PAGE) |
| • Supports up to 16-bits high dynamic range of chromatographic images (TIFF format ) |
| • Batch automatic integration, manual integration, background subtract, smooth, profile combination and truncate |
| • Support external standard method with calibration factors for multi-component quantitative determination |
| • Features include chemical reference definition, group calibration, automatic and manual calibration factor generation |
| • 2D and 3D chromatogram overlapping, profile calculation, retention time alignment, and common pattern modeling |
12.021 | TIC Profiler - Mass Chromatogram Solutions System |
| • Support MS ANDY (AIA) data format |
| • Applicable to GC/MS, LC/MS and TLC/MS chromatogram analysis with all kinds of mass spectrum resolution |
| • EIC, BPI, XIC etc., mass chromatogram generation, average spectrum, mass map (contour) plot, etc. |
| • Batch automatic integration, manual integration, background subtract and truncate |
| • Features include chemical reference definition, group calibration, automatic and manual calibration factor generation |
| • 2D and 3D chromatogram overlapping, profile calculation, retention time alignment, and common pattern modeling |
12.022 | MS Profiler - Mass Deconvolution Solutions System |
| • Support MS ANDY (AIA) data format |
| • For soft ionization ion source GC/MS, LC/MS and TLC/MS data analysis |
| • EIC, BPI, XIC etc., mass chromatogram generation, average spectrum, mass map (contour) plot, etc. |
| • Batch automatic integration, manual integration, background subtract and truncate |
| • Mass deconvolution base on peak model techniques for accurate interpretation of co-eluted chromatographic peaks |
| • Typical LC/MS TIC deconvolution time less than 10s, with isotopic and adduct ions recognition |
| • Molecular feature matching, deconvolution component defination, and deconvolution common pattern modeling |